Flying probe for substrate test

atg offers Flying probe substrate test systems for structures down to 10 µm and several hundred thousand test points per panel.

These systems offer specific solutions for scanning, and capacitance measurement, and utilize temperature management to ensure the highest accuracy.

The Substrate product line is characterized by an outstanding test head technology.

Linear motor drives in combination with ceramic air bearings provide exceptional speed and accuracy.

The S3 is able to test 10 µm structures while achieving 100 measurements per second.

The shuttle of the S3-8 can clamp and tension double sided substrate boards.