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Fully Automated Detection of PCB Manufacturing Tolerances Compatible with LM400 and LM800 Grid Test Systems 2 Telecentric Lenses with High Resolution Cameras Sniper Fully Automated Optical

16 Test Heads High Speed Direct Linear Drives for X and Z motion Light weight Carbon Z-Axis Fully Automatic “Lights-out” Operation Tension Shuttle System for thin core product Fast 300 mA

Latest Generation in advanced technology 8 ultra light carbon fiber test heads Fully Automatic “Lights-out” operation High performance linear motion Granit base for high accuracy and

Latest Generation in advanced technology 8 ultra light carbon fiber test heads Fully Automatic “Lights-out” operation High performance linear motion Granit base for high accuracy and

Latest Generation in advanced technology 8 ultra light carbon fiber test heads High performance linear motion Granit base for high accuracy and repeatability A9 plus Flying Probe Test

Latest Generation in advanced technology 8 ultra light carbon fiber test heads High performance linear motion Granit base for high accuracy and repeatability A9XL Flying Probe Test System

Latest Generation in advanced technology 8 ultra light carbon fiber test heads Fully Automatic “Lights-out” operation High performance linear motion Granit base for high accuracy and

Latest Generation in advanced technology 8 ultra light carbon fiber test heads High performance linear motion Granit base for high accuracy and repeatability A9 plus Flying Probe Test

Latest Generation in advanced technology 8 ultra light carbon fiber test heads High performance linear motion Granit base for high accuracy and repeatability A9 Flying Probe Test System

Latest Generation in advanced technology 8 ultra light carbon fiber test heads Fully Automatic “Lights-out” operation High performance linear motion Granit base for high accuracy and

8 Test Heads Fast Dual Shuttle System High Speed Direct Linear Drives for X and Z motion No Probe Marks Fast 300mA Kelvin Testing S2 plus Flying Probe Test System Double Sided Tester for

8 Test Heads Pneumatic Tension Shuttle for Flex and Inner layer handling Fast 280 mA Kelvin Testing A5 Neo Flying Probe Test System For Rigid and Flexible Boards A5 Neo Technical

8 Test Heads High Speed Direct Linear Drives for X and Z motion Light weight Carbon Z-Axis 4 High Resolution Color Cameras Fast 300 mA Kelvin Testing A8 plus Flying Probe Test System For

8 Test Heads Fully Automatic “Lights-out” operation Dual Shuttle System Tension Option for thin core and flexible panels Fast 300 mA Kelvin Testing A8aL Flying Probe Test System Dual Shuttle

16 Test Heads 20 % higer mechanical speed than A7-16 Light weight Carbon Z-Axis Test System for oversized panels up to 1000 mm Fast 280 mA Kelvin Testing A7-16 Pro Flying Probe Test System For

16 Test Heads High Speed Direct Linear Drives for X and Z motion Light weight Carbon Z-Axis 8 High Resolution Color Cameras Fast 300 mA Kelvin Testing A8-16 Flying Probe Test System For Rigid

LM400 Series Picomat II Double and Quad Density Grid Test System Medium to High Density Accuracy Economical Efficiency Automatic Optical Alignment Low Ohm Testing Front View Side View 14

LM800 Series Picomat II Octal-Density Grid Test System Extra High Density Accuracy Economical Efficiency Automatic Optical Alignment Low Ohm Testing Test Field Size Maximum (X x Y)

Latest Generation in advanced technology 8 ultra light carbon fiber test heads High performance linear motion Granit base for high accuracy and repeatability A9 Flying Probe Test System

一个多功能平台 实现两种可能 MYPro 系列 MY700™ 锡膏喷印机与喷射点胶机 AB59821 MY700 brochure September 2021.indd 1AB59821 MY700 brochure September 2021.indd 1 2022-03-18 13:21:032022-03-18 13:21:03 SMT生产的未来完全不可预测。

8 Test Heads High Speed Direct Linear Drives for X and Z motion Light weight Carbon Z-Axis Fully Automatic “Lights-out” Operation Tension Shuttle System for thin core product Fast 280 mA

Enabling the future of electronics VD-anförande, av Lena Olving 1 Länk till film: Mycronic – The Journey 2016 – Ett rekordår för Mycronic Rekordstark efterfrågan

Enabling the future of electronics VD-anförande, av Lena Olving 1 2016 – Ett rekordår för Mycronic Rekordstark efterfrågan Tillväxt 28%

Enabling the future of electronics VD-anförande, av Lena Olving 1 2016 – Ett rekordår för Mycronic Rekordstark efterfrågan Tillväxt 28%

8 Test Heads Double Sided Test System High Speed Direct Linear Drives for X and Z motion Vacuum table optional No Probe Marks Optical auto focus Microscope Lenses Fast 280 mA Kelvin Testing

8 Test Heads Fast Dual Shuttle System High Speed Direct Linear Drives for X and Z motion No Probe Marks Fast 280mA Kelvin Testing S2-8 plus Flying Probe Test System Double Sided Tester for

16 Test Heads Fast Dual Shuttle System High Speed Direct Linear Drives for X and Z motion No Probe Marks Fast 280mA Kelvin Testing S2-16 plus Flying Probe Test System Double Sided Tester for

AOI 検査装置 マイクロニック検査ソリュー ション MYPro I ™シリ ズー 3D AOI MYPro I シリー ズ 3D AOI で 検査を自動化する 不良ゼロの SMT ラインを達成する―それがマイクロニックの使命です。 新しい MYPro I シリーズ 3D AOI は、オペレーターの介入を最小限に 抑えながら、製品品質と歩留まりを継続的に改善することで、お客様 の工場

A powerful solution for photonic packaging and system assembly Universal hardware with software-defined functionality, designed for scalable manufacturing Freeform waveguides and